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Metallographic Microscophe with camera by Nikon
Motorized Z Axis
EDF (3D surface analysis)
Magnifing: 10x 50x 100x 1000x
Under a little example of 3d scanning of a raw surface.
Problem: Porosity
 

A magnifier with camera

Microhardness
By means of microhardness tester Future-Tech
FM-700 one may execute measurements of hardness by means of Vickers
method: HV0,01 ÷HV1 according to PN-EN ISO 6507-1. The device is
used mostly for measurement of hardness distribution according to
any measurement track. In this manner one may determine inter alia
depth of hardened or softened layer, or by means of embedded
metallographic microscope effect measurements of hardness of
specific structural phases or segregation zones with indenter load:
98.07 ÷ 9807mN. Device facilitates photographic documentation along
with imaging of indentation. Measurement of hardness distribution
may be effected automatically or manually. Device displays result of
hardness measurement by means of Vickers method (HV) with a
possibility of recalculation into any hardness units: HB, HRC, HRA,
HRD, HK, HR15T etc. according to SEA (J-417b), ASTM E-140 and JIS.
Basic scope of the offered tests by means of microhardness testing
machine Future-Tech FM-700:
- Measurement of hardness by means of Vickers method: HV0,01
÷HV1 according to PN-EN ISO 6507-1
- Distribution of hardness as per any measurement line,
- Measurement of microhardness of specific structural phase,
- Measurement of hardened layer depth,
- Assessment of welded joint by means of measurement of
hardness on cross section
Technical parameters of micro-hardness testing
machine Future-Tech FM-700:
| Standard load |
98,07 – 9807 mN
10 – 1000 G |
| Used indenters |
diamond Vickers (HV
diamond Knoop (HK) |
| Measurement
microscope |
Magnification for measurement x400 (lens 40 x ocular 10)
max. measured length 200 µm
min. measurement unit 0.1 µm |
| Hardness value recalculation |
According to SEA (J-417b), ASTM E-140 and JIS |
| Accuracy |
According to JIS B-7734 and ASTM E-384 |
First
X-Ray instrument
| The FISCHERSCOPE X-RAY XUL
is a compact and universally applicable energy-dispersive X-ray
fluorescence measuring instrument. It is well suited for non-destructive
thickness measurements and material analysis.
A high count rate is achieved by using a proportional counter tube,
which allows for precise measurements. Using the Fischer fundamental
parameter method, coating systems as well as solid and liquid samples
can be analyzed standard-free. Elements in the range from chlorine (17)
to uranium (92) are detected.
The XUL has an excellent long-term stability, which among other
things is reflected in a significantly reduced calibration effort.
The instrument is well suited for measurements in quality assurance,
incoming inspection and process control.
Typical areas of application are:
• Measurements on small parts like screws, bolts and nuts
• Measurements on contacts and electronic components
• Solution analysis in the electroplating
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Second X-Ray instrument
Coating Measurament Instrument by Oxford Instruments
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